Model:LDT-TR2022T
The device applies the Vanderbilt measurement method to the linear four-probe. By the ways of two electrical measurements under computer control, it will make analysis of the collected data in the computer and can automatically eliminate the effect of sample geometry, boundary effect, probe inequality and mechanical travel on the measurement results.
● Colleges and Universities
SPECIFICATIONS
Measurement Range | • Specific resistance:10^(-5 )-10^5Ω.cm(Expanding) |
Wafer Thickness | • ≤3mm |
Wafer Diameter | • 140*150mm / 200*200mm / 400*500mm (Depends) |
Constant Flow Source | • 1uA, 10uA, 100uA, 1mA, 10mA, 100mA |
Digital Multimeter | • Range: 000.00-199.99mV / Definition: 10uV / Input Impedance>1000MΩ / Precision: ±0.1% |
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